JPS6437689U - - Google Patents

Info

Publication number
JPS6437689U
JPS6437689U JP13248087U JP13248087U JPS6437689U JP S6437689 U JPS6437689 U JP S6437689U JP 13248087 U JP13248087 U JP 13248087U JP 13248087 U JP13248087 U JP 13248087U JP S6437689 U JPS6437689 U JP S6437689U
Authority
JP
Japan
Prior art keywords
measurement
sample
measurement position
moving
measurement sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13248087U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP13248087U priority Critical patent/JPS6437689U/ja
Publication of JPS6437689U publication Critical patent/JPS6437689U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP13248087U 1987-08-31 1987-08-31 Pending JPS6437689U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13248087U JPS6437689U (en]) 1987-08-31 1987-08-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13248087U JPS6437689U (en]) 1987-08-31 1987-08-31

Publications (1)

Publication Number Publication Date
JPS6437689U true JPS6437689U (en]) 1989-03-07

Family

ID=31389479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13248087U Pending JPS6437689U (en]) 1987-08-31 1987-08-31

Country Status (1)

Country Link
JP (1) JPS6437689U (en])

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5919804A (ja) * 1982-07-26 1984-02-01 Hitachi Ltd 放射線厚さ計のオンライン自動校正装置
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具
JPS60262005A (ja) * 1984-06-09 1985-12-25 Rikagaku Kenkyusho 膜厚計測方法
JPS61223507A (ja) * 1985-03-29 1986-10-04 Fuji Electric Co Ltd 圧延コントロール用放射線透過式厚さ計の校正方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5919804A (ja) * 1982-07-26 1984-02-01 Hitachi Ltd 放射線厚さ計のオンライン自動校正装置
JPS5954913A (ja) * 1982-09-22 1984-03-29 Sumitomo Metal Ind Ltd 放射線厚み計の校正方法及びその治具
JPS60262005A (ja) * 1984-06-09 1985-12-25 Rikagaku Kenkyusho 膜厚計測方法
JPS61223507A (ja) * 1985-03-29 1986-10-04 Fuji Electric Co Ltd 圧延コントロール用放射線透過式厚さ計の校正方法

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